• DocumentCode
    1889926
  • Title

    Control of growth mode and wire width in selective molecular beam epitaxy growth of InGaAs quantum wire arrays on InP [001] substrates

  • Author

    Jiang, Chao ; Muranaka, Tsutomu ; Hasegawa, Hideki

  • Author_Institution
    Res. Center for Integrated Quantum Electron., Hokkaido Univ., Sapporo, Japan
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    553
  • Lastpage
    556
  • Abstract
    Control of the growth mode and the wire width were attempted for selective MBE growth of InGaAs quantum wire (QWR) arrays on patterned [001] InP substrates. InGaAs ridge structure arrays were grown first, and then InAlAs/InGaAs/InAlAs layers were supplied to grow QWR arrays by self-organization. By combining a Ga-stabilized flat-top growth mode and an As stabilized sharp-top growth mode under low V/III ratios for InGaAs ridge structure growth, initial pattern non-uniformity was removed, achieving ridge roughness below a monoatomic step level. Highly uniform and narrow arrow-headed InGaAs QWR arrays were formed under a tight wire width control, showing strong PL emission with a narrow FWHM of 19 meV.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; indium compounds; molecular beam epitaxial growth; photoluminescence; semiconductor epitaxial layers; semiconductor growth; semiconductor quantum wires; FWHM; InAlAs-InGaAs-InAlAs-InP; InAlAs/InGaAs/InAlAs; PL emission; QWR arrays; flat-top growth mode; growth mode; monoatomic step level; pattern nonuniformity; quantum wire arrays; ridge roughness; ridge structure arrays; selective molecular beam epitaxy growth; self-organization; sharp-top growth mode; wire width; Atomic force microscopy; Indium gallium arsenide; Indium phosphide; Molecular beam epitaxial growth; Optical arrays; Phased arrays; Quantum dots; Scanning electron microscopy; Substrates; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials Conference, 2002. IPRM. 14th
  • ISSN
    1092-8669
  • Print_ISBN
    0-7803-7320-0
  • Type

    conf

  • DOI
    10.1109/ICIPRM.2002.1014488
  • Filename
    1014488