Title :
Global time-domain full-wave analysis of microwave FET oscillators and self-oscillating mixers
Author :
Min Chen ; Deal, W.R. ; Houshmand, B. ; Itoh, T.
Author_Institution :
Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
Abstract :
The global time-domain nonlinear analysis of microwave FET oscillators and self-oscillating mixers using the extended FDTD technique is presented. Employing the concept of equivalent current/voltage sources, the device-wave interaction is characterized and incorporated into the FDTD time-stepping algorithm. Consequently, investigation of highly nonlinear phenomena, such as injection locking and intermodulation, can be accomplished by utilizing a large-signal device circuit model. Theoretical results are validated by experiments.
Keywords :
equivalent circuits; finite difference time-domain analysis; injection locked oscillators; intermodulation; microwave mixers; microwave oscillators; nonlinear network analysis; FDTD time-stepping algorithm; device-wave interaction; equivalent current/voltage sources; extended FDTD technique; global time-domain full-wave analysis; highly nonlinear phenomena; injection locking; intermodulation; large-signal device circuit model; microwave FET oscillators; nonlinear analysis; self-oscillating mixers; Circuit analysis; Circuit simulation; Finite difference methods; Frequency; Injection-locked oscillators; Microwave FETs; Microwave oscillators; Nonlinear circuits; Time domain analysis; Voltage;
Conference_Titel :
Microwave Symposium Digest, 1998 IEEE MTT-S International
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
0-7803-4471-5
DOI :
10.1109/MWSYM.1998.705194
