A modular, extendible and reusable test configuration for system-level manufacturing tests

This paper explores an effective solution for a test configuration to perform system-level manufacturing tests without use of system management/user interface software of system under test (SUT). A generic, computer aided and modular test configuration, which acts in combination and in an integrated way with the management unit(s) of the SUT over Ethernet connectivity is proposed as a solution. Using enough number of software modules to be installed on the management unit(s), the proposed test configuration provides a number of improvements compared to the existing test configurations. Parallel testing capability is one of these major improvements meaning that test scenarios may be applied to a certain number of SUTs at the same time independently. This feature accelerates the system-level manufacturing test activities both during the planned test operations and during fault localization cases. The proposed configuration is implemented and used on various systems based on various platforms such as; sheltered C4I platforms, tracked observer or gun platforms, wheeled ground surveying platforms etc.