DocumentCode :
1890832
Title :
Simplify ATE development and measurements
Author :
Kai-Nian Cheah
Author_Institution :
Component Test Div.-Test Accessories Oper., Agilent Technol., Inc., Minden, Malaysia
fYear :
2013
fDate :
16-19 Sept. 2013
Firstpage :
1
Lastpage :
4
Abstract :
RF and microwave switches are used extensively in microwave test systems for signal routing between instruments and devices under test (DUT). Configuring switches into a switch matrix system enables signal routing from multiple instruments to single or multiple DUTs. This allows multiple tests to be performed with the same setup, eliminating the need for frequent connects and disconnects. The entire testing process can be automated, increasing the throughput in high-volume production and measurement intensive environments. This paper discusses how different types of switches can simplify your test setup and measurements. A discussion on how to create a switch matrix that enables multiple measurements with a single connection will also be covered. The last section of this paper will highlight the new USB switch technology, that provides a long operating life and is a convenient solution for RF switching applications.
Keywords :
automatic test equipment; measurement systems; microwave measurement; microwave switches; peripheral interfaces; ATE; DUT; RF switching application; USB switch technology; devices under test; high-volume production; measurement intensive environment; microwave switch; microwave test system; signal routing; switch matrix system; Instruments; Microwave devices; Microwave measurement; Radio frequency; Switches; Testing; Universal Serial Bus; Switches; test measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON, 2013 IEEE
Conference_Location :
Schaumburg, IL
ISSN :
1088-7725
Print_ISBN :
978-1-4673-5681-7
Type :
conf
DOI :
10.1109/AUTEST.2013.6645047
Filename :
6645047
Link To Document :
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