• DocumentCode
    1890832
  • Title

    Simplify ATE development and measurements

  • Author

    Kai-Nian Cheah

  • Author_Institution
    Component Test Div.-Test Accessories Oper., Agilent Technol., Inc., Minden, Malaysia
  • fYear
    2013
  • fDate
    16-19 Sept. 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    RF and microwave switches are used extensively in microwave test systems for signal routing between instruments and devices under test (DUT). Configuring switches into a switch matrix system enables signal routing from multiple instruments to single or multiple DUTs. This allows multiple tests to be performed with the same setup, eliminating the need for frequent connects and disconnects. The entire testing process can be automated, increasing the throughput in high-volume production and measurement intensive environments. This paper discusses how different types of switches can simplify your test setup and measurements. A discussion on how to create a switch matrix that enables multiple measurements with a single connection will also be covered. The last section of this paper will highlight the new USB switch technology, that provides a long operating life and is a convenient solution for RF switching applications.
  • Keywords
    automatic test equipment; measurement systems; microwave measurement; microwave switches; peripheral interfaces; ATE; DUT; RF switching application; USB switch technology; devices under test; high-volume production; measurement intensive environment; microwave switch; microwave test system; signal routing; switch matrix system; Instruments; Microwave devices; Microwave measurement; Radio frequency; Switches; Testing; Universal Serial Bus; Switches; test measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2013 IEEE
  • Conference_Location
    Schaumburg, IL
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4673-5681-7
  • Type

    conf

  • DOI
    10.1109/AUTEST.2013.6645047
  • Filename
    6645047