DocumentCode
1890832
Title
Simplify ATE development and measurements
Author
Kai-Nian Cheah
Author_Institution
Component Test Div.-Test Accessories Oper., Agilent Technol., Inc., Minden, Malaysia
fYear
2013
fDate
16-19 Sept. 2013
Firstpage
1
Lastpage
4
Abstract
RF and microwave switches are used extensively in microwave test systems for signal routing between instruments and devices under test (DUT). Configuring switches into a switch matrix system enables signal routing from multiple instruments to single or multiple DUTs. This allows multiple tests to be performed with the same setup, eliminating the need for frequent connects and disconnects. The entire testing process can be automated, increasing the throughput in high-volume production and measurement intensive environments. This paper discusses how different types of switches can simplify your test setup and measurements. A discussion on how to create a switch matrix that enables multiple measurements with a single connection will also be covered. The last section of this paper will highlight the new USB switch technology, that provides a long operating life and is a convenient solution for RF switching applications.
Keywords
automatic test equipment; measurement systems; microwave measurement; microwave switches; peripheral interfaces; ATE; DUT; RF switching application; USB switch technology; devices under test; high-volume production; measurement intensive environment; microwave switch; microwave test system; signal routing; switch matrix system; Instruments; Microwave devices; Microwave measurement; Radio frequency; Switches; Testing; Universal Serial Bus; Switches; test measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON, 2013 IEEE
Conference_Location
Schaumburg, IL
ISSN
1088-7725
Print_ISBN
978-1-4673-5681-7
Type
conf
DOI
10.1109/AUTEST.2013.6645047
Filename
6645047
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