DocumentCode :
1890854
Title :
Optimal microarchitectural design configuration selection for processor hard-error reliability
Author :
Zhang, Ying ; Duan, Lide ; Li, Bin ; Peng, Lu
Author_Institution :
Dept. of Electr. & Comput. Eng., Louisiana State Univ., Baton Rouge, LA, USA
fYear :
2012
fDate :
19-21 March 2012
Firstpage :
91
Lastpage :
96
Abstract :
Traditional design space exploration mainly focuses on performance and power consumption. However, as one of the first-class constraints for modern processor design, the relationship between hard-error reliability and processor configurations has not been well studied. In this paper, we investigate this relationship by exploring a large processor design space. We employ a rule search strategy, i.e. Patient Rule Induction Method, to generate a set of rules which choose optimal configurations for processor hard-error reliability and its tradeoff with performance and power consumption.
Keywords :
logic design; microprocessor chips; reliability; optimal microarchitectural design configuration selection; patient rule induction method; processor configurations; processor design; processor hard-error reliability; rule search strategy; Benchmark testing; Measurement; Microarchitecture; Radio frequency; Reliability engineering; Training; Design space exploration; reliability; statistical model;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ISQED), 2012 13th International Symposium on
Conference_Location :
Santa Clara, CA
ISSN :
1948-3287
Print_ISBN :
978-1-4673-1034-5
Type :
conf
DOI :
10.1109/ISQED.2012.6187479
Filename :
6187479
Link To Document :
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