What are we able to do with test data or using LabVIEW to hone in on actual cause of failures

As systems/circuits degrade or high failure performance trends occur over time, there is an increased probability of predicting with reasonable confidence, when a given assembly or component is likely to experience an insipient fault or a cause a mission failure. Also, performance trends can be applied to algorithms to enhance the testing process. However, profound predictions can be made accurately which are based on true test data. Using LabVIEW is an excellent way to process actual failure history and to display the results.