• DocumentCode
    1890977
  • Title

    Thermal analysis of 3D integrated circuits based on discontinuous Galerkin finite element method

  • Author

    Zjajo, Amir ; Van der Meijs, Nick ; Van Leuken, Rene

  • Author_Institution
    Circuits & Syst. Group, Delft Univ. of Technol., Delft, Netherlands
  • fYear
    2012
  • fDate
    19-21 March 2012
  • Firstpage
    117
  • Lastpage
    222
  • Abstract
    Even though vertical 3D integration offers increased device density, reduced signal delay, and design flexibility, heat and thermal concerns are, nevertheless, aggravated. In this context, accurate computation of temperature profile is required to establish thermal design rules governing the feasibility of integration options. Within this framework, a novel methodology based on discontinuous Galerkin finite element method for accurate thermal profile estimation of 3D integrated circuits is proposed. The method is utilized to simulate geometrically complicated physical structures with limited complexity overhead.
  • Keywords
    Galerkin method; finite element analysis; integrated circuit design; thermal management (packaging); three-dimensional integrated circuits; 3D integrated circuit; discontinuous Galerkin finite element method; temperature profile; thermal design rule; thermal profile estimation; vertical 3D integration; Boundary conditions; Conductivity; Finite element methods; Integrated circuit modeling; Thermal analysis; Thermal conductivity; Three dimensional displays; 3D IC; Adaptive error control; CAD; Multi-layer; Simulation; Thermal analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2012 13th International Symposium on
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1948-3287
  • Print_ISBN
    978-1-4673-1034-5
  • Type

    conf

  • DOI
    10.1109/ISQED.2012.6187483
  • Filename
    6187483