DocumentCode
1890977
Title
Thermal analysis of 3D integrated circuits based on discontinuous Galerkin finite element method
Author
Zjajo, Amir ; Van der Meijs, Nick ; Van Leuken, Rene
Author_Institution
Circuits & Syst. Group, Delft Univ. of Technol., Delft, Netherlands
fYear
2012
fDate
19-21 March 2012
Firstpage
117
Lastpage
222
Abstract
Even though vertical 3D integration offers increased device density, reduced signal delay, and design flexibility, heat and thermal concerns are, nevertheless, aggravated. In this context, accurate computation of temperature profile is required to establish thermal design rules governing the feasibility of integration options. Within this framework, a novel methodology based on discontinuous Galerkin finite element method for accurate thermal profile estimation of 3D integrated circuits is proposed. The method is utilized to simulate geometrically complicated physical structures with limited complexity overhead.
Keywords
Galerkin method; finite element analysis; integrated circuit design; thermal management (packaging); three-dimensional integrated circuits; 3D integrated circuit; discontinuous Galerkin finite element method; temperature profile; thermal design rule; thermal profile estimation; vertical 3D integration; Boundary conditions; Conductivity; Finite element methods; Integrated circuit modeling; Thermal analysis; Thermal conductivity; Three dimensional displays; 3D IC; Adaptive error control; CAD; Multi-layer; Simulation; Thermal analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design (ISQED), 2012 13th International Symposium on
Conference_Location
Santa Clara, CA
ISSN
1948-3287
Print_ISBN
978-1-4673-1034-5
Type
conf
DOI
10.1109/ISQED.2012.6187483
Filename
6187483
Link To Document