Title :
Leakage-aware performance-driven TSV-planning based on network flow algorithm in 3D ICs
Author :
Wang, Kan ; Dong, Sheqin ; Ma, Yuchun ; Satoshi, Goto ; Cong, Jason
Author_Institution :
Dept. of Comput. Sci. & Technol., Tsinghua Univ., Beijing, China
Abstract :
3D IC has become an attractive technology as it decreases interconnection distance and improves performance. However, it is faced with heat dissipation and temperature problem seriously. The high temperature will increase the interconnection delay, and lead to degradation of performance. Through-silicon-via (TSV) has been shown as an effective way to optimize heat distribution. However, the distribution of TSVs will potentially influence the interconnection delay. In this paper, we propose a performance-driven 3D TSV-planning (3D-PTSP) algorithm, which can generate good TSV distribution, to improve temperature. The thermal effects on critical path delay are analyzed with leakage power-temperature-delay dependence considered. A priority based TSV redistribution algorithm and network flow based signal via allocation algorithm help to improve both TSV number and critical path delay without increasing temperature. Experimental results show that the proposed method can improve total via number by 8.9% and reduce critical path delay by 15.8%.
Keywords :
integrated circuit interconnections; thermal management (packaging); three-dimensional integrated circuits; 3D IC; heat dissipation; heat distribution; interconnection delay; leakage power-temperature-delay dependence; leakage-aware performance-driven TSV-planning; network flow algorithm; network flow based signal via allocation algorithm; performance-driven 3D TSV-planning algorithm; priority based TSV redistribution algorithm; temperature problem; thermal effect; through-silicon-via; Delay; Resource management; Routing; Three dimensional displays; Through-silicon vias; Tiles; Wires; Critical path delay; Leakage power; Leakage power-temperature-delay dependence; Signal TSV allocation;
Conference_Titel :
Quality Electronic Design (ISQED), 2012 13th International Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4673-1034-5
DOI :
10.1109/ISQED.2012.6187485