• DocumentCode
    1891034
  • Title

    Leakage-aware performance-driven TSV-planning based on network flow algorithm in 3D ICs

  • Author

    Wang, Kan ; Dong, Sheqin ; Ma, Yuchun ; Satoshi, Goto ; Cong, Jason

  • Author_Institution
    Dept. of Comput. Sci. & Technol., Tsinghua Univ., Beijing, China
  • fYear
    2012
  • fDate
    19-21 March 2012
  • Firstpage
    129
  • Lastpage
    136
  • Abstract
    3D IC has become an attractive technology as it decreases interconnection distance and improves performance. However, it is faced with heat dissipation and temperature problem seriously. The high temperature will increase the interconnection delay, and lead to degradation of performance. Through-silicon-via (TSV) has been shown as an effective way to optimize heat distribution. However, the distribution of TSVs will potentially influence the interconnection delay. In this paper, we propose a performance-driven 3D TSV-planning (3D-PTSP) algorithm, which can generate good TSV distribution, to improve temperature. The thermal effects on critical path delay are analyzed with leakage power-temperature-delay dependence considered. A priority based TSV redistribution algorithm and network flow based signal via allocation algorithm help to improve both TSV number and critical path delay without increasing temperature. Experimental results show that the proposed method can improve total via number by 8.9% and reduce critical path delay by 15.8%.
  • Keywords
    integrated circuit interconnections; thermal management (packaging); three-dimensional integrated circuits; 3D IC; heat dissipation; heat distribution; interconnection delay; leakage power-temperature-delay dependence; leakage-aware performance-driven TSV-planning; network flow algorithm; network flow based signal via allocation algorithm; performance-driven 3D TSV-planning algorithm; priority based TSV redistribution algorithm; temperature problem; thermal effect; through-silicon-via; Delay; Resource management; Routing; Three dimensional displays; Through-silicon vias; Tiles; Wires; Critical path delay; Leakage power; Leakage power-temperature-delay dependence; Signal TSV allocation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2012 13th International Symposium on
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1948-3287
  • Print_ISBN
    978-1-4673-1034-5
  • Type

    conf

  • DOI
    10.1109/ISQED.2012.6187485
  • Filename
    6187485