• DocumentCode
    1891419
  • Title

    Design challenges for 0.1 um and beyond

  • Author

    Sakurai, Takayasu

  • Author_Institution
    Center for Collaborative Res., Tokyo Univ., Japan
  • fYear
    2000
  • fDate
    9-9 June 2000
  • Firstpage
    553
  • Lastpage
    558
  • Abstract
    If we look into the scaling law carefully, we find that three crises can be stringent in realizing LSI´s for 0.1 um and beyond: namely power crisis, interconnection crisis, and complexity crisis. This paper describes these crises and possible solutions to cope with the problems.
  • Keywords
    integrated circuit design; large scale integration; 0.1 micron; deep-submicron LSI design; scaling law; Collaboration; Costs; Delay effects; Energy consumption; Integrated circuit interconnections; Large scale integration; Leakage current; Power system interconnection; Publishing; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2000. Proceedings of the ASP-DAC 2000. Asia and South Pacific
  • Conference_Location
    Yokohama, Japan
  • Print_ISBN
    0-7803-5973-9
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2000.835162
  • Filename
    835162
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1891419