DocumentCode :
1891434
Title :
Fast delay estimation with buffer insertion for through-silicon-via-based 3D interconnects
Author :
Lee, Young-Joon ; Lim, Sung Kyu
Author_Institution :
Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2012
fDate :
19-21 March 2012
Firstpage :
228
Lastpage :
335
Abstract :
For successful adoption of through-silicon-via-based 3D ICs, delay estimation techniques of 3D interconnects for early design stages are required. The 3D nets may connect gates/macros placed far apart and through-silicon-vias (TSVs) have large parasitic capacitances. Thus, buffers are inserted to reduce interconnect delay. To make good decisions in early design stages, the estimation of buffered delay should be fast and reasonably accurate. However, there has been no buffered delay estimation work for 3D ICs that considers proper delay models and TSV RC parasitics. In this work, we investigate several analytical delay models for 3D net delay estimation. Then, based on analytical formula and our heuristic algorithm, we propose how to estimate the buffered delay for movable TSV cases and fixed TSV cases. The effectiveness of our delay estimation technique is demonstrated with various 3D nets. Compared with the van Ginneken buffer insertion based delay estimation, our estimation provides solutions about 750 times faster with almost the same estimated delay.
Keywords :
integrated circuit interconnections; three-dimensional integrated circuits; 3D net delay estimation; TSV RC parasitics; buffer insertion; buffered delay estimation; delay model; heuristic algorithm; parasitic capacitance; through-silicon-via-based 3D IC; through-silicon-via-based 3D interconnect; Capacitance; Delay estimation; Logic gates; Mathematical model; Three dimensional displays; Through-silicon vias; 3D IC; buffer insertion; delay estimation; through-silicon-via;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ISQED), 2012 13th International Symposium on
Conference_Location :
Santa Clara, CA
ISSN :
1948-3287
Print_ISBN :
978-1-4673-1034-5
Type :
conf
DOI :
10.1109/ISQED.2012.6187499
Filename :
6187499
Link To Document :
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