DocumentCode :
1891520
Title :
ATE hardware independent TPS development using a reconfigurable test executive
Author :
Savas, Zafer ; Arik, Muharrem
Author_Institution :
Test Eng. Dept., ASELSAN Inc., Ankara, Turkey
fYear :
2013
fDate :
16-19 Sept. 2013
Firstpage :
1
Lastpage :
5
Abstract :
A Test Executive software is the main software part of an Automatic Test System (ATS) and its main function is to execute test steps sequentially. Other software that builds the ATS can be listed as; TPSs which perform the Device Under Test (DUT) specific functional tests, Operator Interface which is the part Test Operator interacts with, Instrument Libraries which are responsible for communicating with the ATE Hardware and Database for recording the test results. General approach for software development in ATS is to use an ATE hardware independent test executive and developing ATE hardware dependent, DUT specific TPSs. According to this perspective, TPS developers shall consider ATE hardware configuration such as test instrument communication interface type or addresses while developing their codes. Using well-prepared instrument library and reconfigurable test executives, it is possible to reduce the ATE hardware dependency of TPSs This paper discusses the architecture of a cost-effective, reconfigurable test executive software named “ARTS”, which stands for “ASELSAN Reconfigurable Test executive Software”. ARTS was designed during the development of an I-Level test set for a Helicopter Electronic Warfare System to eliminate the hardware dependency of the TPSs.
Keywords :
automatic test equipment; electronic warfare; helicopters; reconfigurable architectures; ARTS; ASELSAN reconfigurable test executive software; ATE hardware independent TPS DEVELOPMENT; automatic test system; device under test; helicopter electronic warfare system; reconfigurable test executive; test executive software; Databases; Hardware; Instruments; Libraries; Radio frequency; Software; Subspace constraints; ARTS; ATE Hardware Independent TPS; Reconfigurable Test Executive;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON, 2013 IEEE
Conference_Location :
Schaumburg, IL
ISSN :
1088-7725
Print_ISBN :
978-1-4673-5681-7
Type :
conf
DOI :
10.1109/AUTEST.2013.6645072
Filename :
6645072
Link To Document :
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