Title :
An isolation technology for joined tungsten MEMS
Author :
Chen, Liang-Yuh ; Santos, Edval J.P. ; MacDonald, Noel C.
Author_Institution :
Sch. of Electr. Eng., Cornell Univ., Ithaca, NY, USA
Abstract :
An isolation technology utilizing a selective chemical vapor deposition (CVD) of tungsten to fabricate released, joined and isolated microelectromechanical structures (MEMS) is presented. The isolation scheme features released tungsten structures that are both mechanically joined and electrically isolated by silicon nitride and offers extra design freedom for micromachining. The technology is used to fabricate an isolated-tungsten, serial-parallel (SP), linear electrostatic, capacitive actuator. The actuator is composed of a series of released silicon nitride hinges. Experiments demonstrate that a controlled large lateral displacement range (e.g., greater than 10 μm) is achieved at modest voltages. Stable stepping motion is a major characteristic of the SP actuator. The fabrication and the operation of this linear actuator are reported
Keywords :
chemical vapour deposition; electric actuators; electrostatic devices; masks; metallisation; micromechanical devices; sputter etching; tungsten; Si; Si wafer; Si3N4; W; capacitive actuator; controlled large lateral displacement range; electrically isolated; fabrication; isolation technology; joined MEMS; linear actuator; linear electrostatic; mechanically joined; microactuators; microgripper; micromachining; selective chemical vapor deposition; serial-parallel; stable stepping motion; three-mask process; Chemical technology; Chemical vapor deposition; Electrostatic actuators; Fasteners; Hydraulic actuators; Isolation technology; Micromachining; Micromechanical devices; Silicon; Tungsten;
Conference_Titel :
Micro Electro Mechanical Systems, 1993, MEMS '93, Proceedings An Investigation of Micro Structures, Sensors, Actuators, Machines and Systems. IEEE.
Conference_Location :
Fort Lauderdale, FL
Print_ISBN :
0-7803-0957-X
DOI :
10.1109/MEMSYS.1993.296924