Title :
A sigma-delta modulation based BIST scheme for mixed-signal circuits
Author :
Huang, Jiun-Lang ; Cheng, Kwang-Ting
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
Abstract :
In this work, we present the analysis of a built-in self-test (BIST) scheme for mixed-signal circuits that is intended to provide on-chip stimulus generation and response analysis. Based on the sigma-delta modulation principle, the proposed scheme can produce high-quality stimuli and obtain accurate measurements without the need of precise analog circuitry. Numerical simulations are conducted to validate our idea and the results show that the scheme is a promising BIST approach for mixed-signal circuits.
Keywords :
automatic testing; integrated circuit testing; mixed analogue-digital integrated circuits; sigma-delta modulation; ASIC testing; built-in self-test scheme; mixed-signal circuits; onchip response analysis; onchip stimulus generation; sigma-delta modulation based BIST scheme; Built-in self-test; Circuit testing; Delta-sigma modulation; Digital filters; Numerical simulation; Performance evaluation; Signal analysis; Signal generators; System testing; Transfer functions;
Conference_Titel :
Design Automation Conference, 2000. Proceedings of the ASP-DAC 2000. Asia and South Pacific
Conference_Location :
Yokohama, Japan
Print_ISBN :
0-7803-5973-9
DOI :
10.1109/ASPDAC.2000.835172
