DocumentCode
1891729
Title
A sigma-delta modulation based BIST scheme for mixed-signal circuits
Author
Huang, Jiun-Lang ; Cheng, Kwang-Ting
Author_Institution
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
fYear
2000
fDate
9-9 June 2000
Firstpage
605
Lastpage
610
Abstract
In this work, we present the analysis of a built-in self-test (BIST) scheme for mixed-signal circuits that is intended to provide on-chip stimulus generation and response analysis. Based on the sigma-delta modulation principle, the proposed scheme can produce high-quality stimuli and obtain accurate measurements without the need of precise analog circuitry. Numerical simulations are conducted to validate our idea and the results show that the scheme is a promising BIST approach for mixed-signal circuits.
Keywords
automatic testing; integrated circuit testing; mixed analogue-digital integrated circuits; sigma-delta modulation; ASIC testing; built-in self-test scheme; mixed-signal circuits; onchip response analysis; onchip stimulus generation; sigma-delta modulation based BIST scheme; Built-in self-test; Circuit testing; Delta-sigma modulation; Digital filters; Numerical simulation; Performance evaluation; Signal analysis; Signal generators; System testing; Transfer functions;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2000. Proceedings of the ASP-DAC 2000. Asia and South Pacific
Conference_Location
Yokohama, Japan
Print_ISBN
0-7803-5973-9
Type
conf
DOI
10.1109/ASPDAC.2000.835172
Filename
835172
Link To Document