A benchmark suite for substrate analysis

The paper proposes an initial benchmark set, suitable for substrate analysis and test. The aim is to help accurately represent electrical noise injected into and picked up from substrate in a variety of high performance circuits. Creating an accurate image of such noise is becoming a critical requirement with the expansion of real plug-and-play style designs. Several important methods for the analysis of substrate parasitic coupling are reviewed in light of the effect substrate noise has on the performance of analog and digital ICs over a wide frequency spectrum. The requirements and formats for each benchmark are described in full detail to allow possible algorithmic as well as signal integrity tests.