Substrate crosstalk analysis in mixed signal CMOS integrated circuits

Substrate crosstalk modeling and analysis techniques for a reliable SoC oriented mixed signal IC design are outlined. Substrate noise measurements by use of a source follower and a latched comparator clearly indicate that L/spl middot/di/dt and R/spl middot/i effects on Vdd/Gnd wirings appear in the substrate. An experimental full chip substrate crosstalk verification system based on a macroscopic substrate noise model efficiently analyses the analog performance degradation relevant to the digital activity on the same chip.