Title :
Behavior of Nanomagnet Logic in the presence of thermal noise
Author :
Csaba, Gyögy ; Porod, Wolfgang
Author_Institution :
Center for Nano Sci. & Technol. (NDnano), Univ. of Notre Dame, Notre Dame, IN, USA
Abstract :
We use numerical simulations to analyze the behavior of Nanomagnet Logic (NML) in the presence of room-temperature thermal fluctuations and discuss simple models to estimate temperature-induced error rates in these devices. Our calculations show that small NML gates - composed of sub-100 nm size dots - are sufficiently stable against temperature fluctuations, but thermal noise imposes design constraints for structures with long signal paths.
Keywords :
logic design; logic gates; nanomagnetics; thermal noise; NML gates; design constraints; nanomagnet logic; numerical simulations; room-temperature thermal fluctuations; signal paths; temperature fluctuations; temperature-induced error rates; thermal noise; Clocks; Error analysis; Magnetic switching; Magnetization; Perpendicular magnetic anisotropy; Switches; Micromagnetics; Nanomagnet logic; Thermally activated switching;
Conference_Titel :
Computational Electronics (IWCE), 2010 14th International Workshop on
Conference_Location :
Pisa
Print_ISBN :
978-1-4244-9383-8
DOI :
10.1109/IWCE.2010.5677954
