• DocumentCode
    1892134
  • Title

    Design and optimization of power gating for DVFS applications

  • Author

    Xu, Tong ; Li, Peng

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Texas A&M Univ., College Station, TX, USA
  • fYear
    2012
  • fDate
    19-21 March 2012
  • Firstpage
    391
  • Lastpage
    397
  • Abstract
    Combined with dynamic voltage and frequency scaling (DVFS), power gating can be used effectively to improve the overall power efficiency of a chip design. Since the DVFS is applied to multiple supply voltage levels, the design tradeoffs between supply noise and power saving can vary significantly across different operating points. Hence, the tradeoffs have to be considered carefully by designers. In this paper, a systematic design tradeoff analysis for power gating geared towards DVFS applications is presented. We propose a multi-driver based scheme to drive sleep transistors. Re-routable decoupling capacitance based design strategies are used to balance supply noises and power saving at different supply levels. Finally, we demonstrate a simulation-based automatic design flow to improve the performance of power delivery network.
  • Keywords
    driver circuits; integrated circuit design; integrated circuit noise; power aware computing; power supply circuits; transistor circuits; DVFS applications; chip design; design tradeoffs; drive sleep transistors; dynamic voltage and frequency scaling; multidriver based scheme; power delivery network; power efficiency; power gating; power saving; re-routable decoupling capacitance based design strategy; simulation-based automatic design flow; supply levels; supply noises; supply voltage levels; systematic design tradeoff analysis; Leakage current; Logic gates; Noise; Power demand; Switches; Switching circuits; Transistors; DVFS; leakage saving; power-gating; supply noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2012 13th International Symposium on
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1948-3287
  • Print_ISBN
    978-1-4673-1034-5
  • Type

    conf

  • DOI
    10.1109/ISQED.2012.6187523
  • Filename
    6187523