DocumentCode
1892242
Title
Noise analysis and comparison of analog and digital readout integrated circuits for infrared focal plane arrays
Author
Andreou, Andreas G. ; Pouliquen, Philippe O. ; Rizk, Charbel
Author_Institution
Dept. of Electr. & Comput. Eng., Johns Hopkins Univ., Baltimore, MD
fYear
2009
fDate
18-20 March 2009
Firstpage
695
Lastpage
700
Abstract
We analyze the traditional analog ROIC architecture and an oversampled Sigma-Delta modulator/decimator architecture. We show how the latter has superior characteristics i.e. an improved maximum signal to noise ratio (SNRMAX). This is a result of effectively increasing the well capacity by a factor equal to the oversampling ratio (OSR). We also provide a high fidelity noise model for both an analog and the digital ROIC and show that the equivalent electron noise at the output of the digital ROIC is much less compared to the traditional analog ROICs.
Keywords
analogue integrated circuits; digital integrated circuits; digital readout; focal planes; integrated circuit noise; modulators; sigma-delta modulation; analog-digital readout integrated circuits; delta-sigma modulator-decimator architecture; digital ROIC; infrared focal plane arrays; noise analysis; oversampling ratio; Analog integrated circuits; CMOS technology; Capacitance; Capacitors; Computer architecture; Digital integrated circuits; Electrons; Infrared imaging; Integrated circuit noise; Photonic integrated circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Sciences and Systems, 2009. CISS 2009. 43rd Annual Conference on
Conference_Location
Baltimore, MD
Print_ISBN
978-1-4244-2733-8
Electronic_ISBN
978-1-4244-2734-5
Type
conf
DOI
10.1109/CISS.2009.5054808
Filename
5054808
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