DocumentCode :
1892372
Title :
Ordinary Kriging metamodel-assisted Ant Colony algorithm for fast analog design optimization
Author :
Okobiah, Oghenekarho ; Mohanty, Saraju P. ; Kougianos, Elias
Author_Institution :
NanoSystem Design Lab., Univ. of North Texas, Denton, TX, USA
fYear :
2012
fDate :
19-21 March 2012
Firstpage :
458
Lastpage :
463
Abstract :
This paper explores an ordinary Kriging based metamodeling technique that allows designers to create a model of a circuit with very good accuracy, while greatly reducing the time required for simulations. Regression and interpolation based methods have been researched extensively and are a commonly used technique for creating metamodels. However, they do not take into account the effect of correlation between design and process parameters, which are critical in the nanoscale regime. Kriging provides an improved metamodeling technique which takes into effect correlation effects during the metamodel generation phase. The ordinary Kriging metamodels are subjected to an Ant Colony Optimization (ACO) algorithm that enables fast optimization of the circuit. This design methodology is evaluated on a sense amplifier circuit as a case study. The results show that the Kriging based metamodels are very accurate and the ACO based algorithm optimizes the sense amplifier precharge time with power consumption as a design constraint in an average time of 3.7 minutes (optimization on the metamodel), compared to 72 hours (optimization on the SPICE netlist).
Keywords :
amplifiers; analogue integrated circuits; integrated circuit modelling; interpolation; optimisation; SPICE netlist; a design constraint; analog design optimization; correlation effects; integrated circuit modelling; interpolation; metamodel generation phase; ordinary Kriging metamodel-assisted ant colony algorithm; regression; sense amplifier precharge time; Accuracy; Algorithm design and analysis; Computational modeling; Correlation; Metamodeling; Optimization; Response surface methodology; Kriging Methods; Metamodeling; Nano-CMOS; Robust Design; Sense Amplifier;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ISQED), 2012 13th International Symposium on
Conference_Location :
Santa Clara, CA
ISSN :
1948-3287
Print_ISBN :
978-1-4673-1034-5
Type :
conf
DOI :
10.1109/ISQED.2012.6187533
Filename :
6187533
Link To Document :
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