• DocumentCode
    1892731
  • Title

    InP based material for long wavelength optoelectronics grown in a 24×2" (8×4") multiwafer Planetary Reactor® for mass production

  • Author

    Christiansen, K. ; Hofeldt, J. ; Dauelsberg, M. ; Deufel, M. ; Heuken, M. ; Juergensen, H.

  • Author_Institution
    Aixtron AG, Aachen, Germany
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    655
  • Lastpage
    657
  • Abstract
    In order to increase the throughput in the production of long wavelength optoelectronics devices there is a growing demand for InP based materials to be grown in multiwafer reactors. In this paper we will present reactor simulations and results of the growth of InP based material in a Planetary Reactor®. The reactor that has been used was an AIX 2600G3 system in the 8×4" (24×2") configuration. Based on modeling results we achieved an excellent temperature distribution in the reaction chamber resulting in very good thickness and doping uniformity confirmed by XRD diffraction and Hall-effect measurements on the wafers meeting the specifications of the optoelectronics industry.
  • Keywords
    Hall effect; III-V semiconductors; MOCVD; X-ray diffraction; indium compounds; optoelectronic devices; temperature distribution; vapour phase epitaxial growth; AIX 2600G3 system; Hall-effect measurements; InP; MOCVD; XRD diffraction; doping uniformity; long wavelength optoelectronics; mass production; multiwafer Planetary Reactor; reactor simulations; temperature distribution; throughput; Doping; Indium phosphide; Inductors; Mass production; Optoelectronic devices; Semiconductor device modeling; Semiconductor process modeling; Temperature distribution; Throughput; X-ray scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials Conference, 2002. IPRM. 14th
  • ISSN
    1092-8669
  • Print_ISBN
    0-7803-7320-0
  • Type

    conf

  • DOI
    10.1109/ICIPRM.2002.1014599
  • Filename
    1014599