• DocumentCode
    1892843
  • Title

    Pushing the limits of lithography for IC production

  • Author

    Brunner, T.

  • Author_Institution
    IBM Corp., Hopewell Junction, NY, USA
  • fYear
    1997
  • fDate
    10-10 Dec. 1997
  • Firstpage
    9
  • Lastpage
    13
  • Abstract
    Advanced lithography approaches will be reviewed from the point of view of volume production applications. Three key questions will be considered: 1. At what design rule will optical lithography die? 2. What are the requirements for a production-worthy lithography? 3. What are the prospects for a non-optical lithography meeting all of these requirements? The high productivity and maturity of optical lithographic processes constitutes a huge "activation energy barrier" that any non-optical approach must break through. At the present time, all non-optical lithographic techniques are far behind the overall production capability of optical techniques. 1x X-ray proximity printing is the most mature post-optical lithography.
  • Keywords
    integrated circuit technology; lithography; IC production; X-ray proximity printing; design rule; lithography; nonoptical lithography; optical lithography; productivity; volume production; Costs; Lithography; Optical devices; Optical distortion; Optical films; Optical noise; Pattern matching; Production; Productivity; Resists;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1997. IEDM '97. Technical Digest., International
  • Conference_Location
    Washington, DC, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-4100-7
  • Type

    conf

  • DOI
    10.1109/IEDM.1997.649433
  • Filename
    649433