Title :
24% Power reduction by post-fabrication dual supply voltage control of 64 voltage domains in VDDmin limited ultra low voltage logic circuits
Author :
Yasufuku, Tadashi ; Hirairi, Koji ; Pu, Yu ; Zheng, Yun Fei ; Takahashi, Ryo ; Sasaki, Masato ; Fuketa, Hiroshi ; Muramatsu, Atsushi ; Nomura, Masahiro ; Shinohara, Hirofumi ; Takamiya, Makoto ; Sakurai, Takayasu
Author_Institution :
Univ. of Tokyo, Tokyo, Japan
Abstract :
A post-fabrication dual supply voltage (VDD) control (PDVC) of multiple voltage domains is proposed for a minimum operating voltage (VDDmin)-limited ultra low voltage logic circuits. PDVC effectively reduces an average VDD below VDDmin, thereby reducing the power consumption of logic circuits. PDVC is applied to a DES CODEC´S circuit fabricated in 65nm CMOS. The layout of DES CODEC´S is divided into 64 VDD domains and each domain size is 54μm × 63.2μm. High VDD (VDDH) or low VDD (VDDL) is applied to each domain and the selection of VDD´s is performed based on multiple built-in self tests. VDDH is selected in VDDmin-critical domains, while VDDL is selected in VDDmin-non-critical domains. A maximum 24% power reduction was measured with the proposed PDVC at 300kHz, VDDH = 3D437mV, and VDDL = 3D397mV.
Keywords :
CMOS logic circuits; built-in self test; integrated circuit testing; low-power electronics; CMOS technology; DES CODEC´S circuit fabrication; PDVC; frequency 300 kHz; maximum power reduction measurement; minimum operating voltage-limited ultra low voltage logic circuit; multiple built-in self testing; multiple voltage domain; post-fabrication dual supply voltage control; power consumption reduction; size 65 nm; voltage 397 mV; voltage 437 mV; CMOS integrated circuits; Codecs; Layout; Logic circuits; Logic gates; Power measurement; Voltage control; Low voltage logic circuit; dual supply voltage; fine-grain power supply voltage; low power;
Conference_Titel :
Quality Electronic Design (ISQED), 2012 13th International Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4673-1034-5
DOI :
10.1109/ISQED.2012.6187553