DocumentCode
1892979
Title
Electrical noise in gold nanoparticle chemiresistors
Author
Covington, Elizabeth L. ; Turner, Richard W. ; Kurdak, Çagliyan ; Rowe, Michael P. ; Xu, Chao ; Zellers, And Edward T
Author_Institution
Dept. of Phys., Univ. of Michigan, Ann Arbor, MI
fYear
2008
fDate
26-29 Oct. 2008
Firstpage
102
Lastpage
105
Abstract
We studied electrical noise of gold nanoparticle chemical sensors with the intent of improving their limit of detection. All the sensors exhibit 1/f-type noise at low frequencies. The magnitude of the noise is found to be strongly dependent on the thickness of the films. The sensors containing a single monolayer of nanoparticles had the highest resistance and the worst noise performance. By making the films thicker, we were able to lower the 1/f noise by five orders of magnitude. The nanoparticle deposition of the thicker films was done with a micro-dispensing system, which resulted in highly non-uniform, coffee-stain patterned films. To get films of different thicknesses, we varied the number of drops deposited on each sensor. The noise prefactor extracted from different devices scaled linearly with the resistance of sensors. The effects of electron beam cross-linking were also studied and found to lower the noise of the sensors.
Keywords
1/f noise; chemical sensors; gold; nanoparticles; 1/f noise; Au; chemical sensors; detection limit; electrical noise; electron beam cross-linking; gold nanoparticle chemiresistors; Chemical sensors; Electrodes; Electron beams; Gas detectors; Gold; Low-frequency noise; Nanoparticles; Noise measurement; Sensor arrays; Sensor systems;
fLanguage
English
Publisher
ieee
Conference_Titel
Sensors, 2008 IEEE
Conference_Location
Lecce
ISSN
1930-0395
Print_ISBN
978-1-4244-2580-8
Electronic_ISBN
1930-0395
Type
conf
DOI
10.1109/ICSENS.2008.4716393
Filename
4716393
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