Title :
Fully self-consistent simulation of silicon nanocrystal-based single-electron transistors
Author :
Talbo, Vincent ; Valentin, Audrey ; Galdin-Retailleau, Sylvie ; Dollfus, Philippe
Author_Institution :
Inst. d´´Electron. Fondamentale, Univ. Paris-Sud, Orsay, France
Abstract :
A three-dimensional (3D) simulator of semiconducting nanocrystal-based single-electron transistors (SETs) is presented. It is based on the self-consistent solution of Poisson and Schrodinger equations. The resulting wave functions are used to compute the bias-dependent tunneling rates in the weak dot to leads coupling limit. These rates are used as input data of a Monte Carlo code which treats the sequential transport of electrons through the tunnel barriers. The simulator was applied to a typical silicon nanocrystal (Si-NC) SET. The resulting I-VGS characteristics and the influence of temperature are discussed in terms of tunneling rates, chemical potentials and wave functions.
Keywords :
Monte Carlo methods; Poisson equation; Schrodinger equation; elemental semiconductors; nanostructured materials; silicon; single electron transistors; 3D simulator; I-VGS characteristic; Monte Carlo code; Poisson equation; Schrodinger equation; Si-NC SET; bias-dependent tunneling rate; chemical potential; self-consistent simulation; semiconducting nanocrystal; silicon nanocrystal; single-electron transistor; wave function; Electric potential; Logic gates; Mathematical model; Silicon; Tunneling; Wave functions;
Conference_Titel :
Computational Electronics (IWCE), 2010 14th International Workshop on
Conference_Location :
Pisa
Print_ISBN :
978-1-4244-9383-8
DOI :
10.1109/IWCE.2010.5677994