• DocumentCode
    1893145
  • Title

    Fully self-consistent simulation of silicon nanocrystal-based single-electron transistors

  • Author

    Talbo, Vincent ; Valentin, Audrey ; Galdin-Retailleau, Sylvie ; Dollfus, Philippe

  • Author_Institution
    Inst. d´´Electron. Fondamentale, Univ. Paris-Sud, Orsay, France
  • fYear
    2010
  • fDate
    26-29 Oct. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A three-dimensional (3D) simulator of semiconducting nanocrystal-based single-electron transistors (SETs) is presented. It is based on the self-consistent solution of Poisson and Schrodinger equations. The resulting wave functions are used to compute the bias-dependent tunneling rates in the weak dot to leads coupling limit. These rates are used as input data of a Monte Carlo code which treats the sequential transport of electrons through the tunnel barriers. The simulator was applied to a typical silicon nanocrystal (Si-NC) SET. The resulting I-VGS characteristics and the influence of temperature are discussed in terms of tunneling rates, chemical potentials and wave functions.
  • Keywords
    Monte Carlo methods; Poisson equation; Schrodinger equation; elemental semiconductors; nanostructured materials; silicon; single electron transistors; 3D simulator; I-VGS characteristic; Monte Carlo code; Poisson equation; Schrodinger equation; Si-NC SET; bias-dependent tunneling rate; chemical potential; self-consistent simulation; semiconducting nanocrystal; silicon nanocrystal; single-electron transistor; wave function; Electric potential; Logic gates; Mathematical model; Silicon; Tunneling; Wave functions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Electronics (IWCE), 2010 14th International Workshop on
  • Conference_Location
    Pisa
  • Print_ISBN
    978-1-4244-9383-8
  • Type

    conf

  • DOI
    10.1109/IWCE.2010.5677994
  • Filename
    5677994