DocumentCode
1893304
Title
Creep-fatigue modelling for solder-joint reliability predictions including the microstructural evolution of the solder
Author
Frost, H.J. ; Howard, R.T.
Author_Institution
Thayer Sch. of Eng., Dartmouth Coll., Hanover, NH, USA
fYear
1990
fDate
20-23 May 1990
Firstpage
482
Abstract
A model is developed for the effect of microstructural evolution (precipitation and dissolution of tin particles) during the thermal-cycling fatigue of low-tin, lead-tin solders. It is shown that the effect of changing the cycle frequency is intertwined with the effect of change the cyclic temperature limits. Because both the precipitation rate and the dissolution rate depend on temperature, it is expected that the boundary between low frequency and high frequency depends on the temperature limits involved. The situation is complicated by the fact that the dissolution rate depends not just on alloy composition and dissolution temperature, but also on the temperature at which precipitate structure was formed. A proper estimate of the frequency boundary must take this into account. It is concluded that a proper extrapolation of the mechanical behavior from one set of conditions to another must take the microstructural evolution into account
Keywords
creep; environmental testing; lead alloys; life testing; reliability; soldering; tin alloys; creep fatigue modeling; cycle frequency; cyclic temperature limits; dissolution rate; extrapolation of mechanical behaviour; microstructural evolution; precipitation rate; solder-joint reliability predictions; thermal-cycling fatigue; Creep; Fatigue; Frequency; Microstructure; Predictive models; Soldering; Temperature; Thermal expansion; Thermal resistance; Thermal stresses;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1990. ., 40th
Conference_Location
Las Vegas, NV
Type
conf
DOI
10.1109/ECTC.1990.122232
Filename
122232
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