• DocumentCode
    1893470
  • Title

    Model-based resolution enhancement of a miniaturized ion mobility spectrometer

  • Author

    Barth, Sebastian ; Baether, Wolfgang ; Zimmermann, Stefan

  • Author_Institution
    Res. Unit, Draegerwerk AG & Co. KGaA, Lubeck
  • fYear
    2008
  • fDate
    26-29 Oct. 2008
  • Firstpage
    180
  • Lastpage
    183
  • Abstract
    A numerical model has been used to study the effect of various design parameters on the resolution of our miniaturized ion mobility spectrometer (IMS). This multiphysics model is based on a finite element approach and gives a detailed insight into the convection and migration of gaseous ions in the spectrometer. It can be also applied to other aspiration condenser type IMS. As reported earlier, physical ion-ion and ion-molecule interactions are considered to achieve an adequate accuracy of the simulations. With good conformity between simulations and measurements, both resolution and simplicity of our design could be significantly improved. The optimized IMS can be used in cost and size-limited applications where chemical substances have to be identified at low ppb-level concentrations within seconds.
  • Keywords
    convection; finite element analysis; ion mobility; ion-molecule reactions; aspiration condenser; convection; finite element analysis; gaseous ion migration; ion-ion interaction; ion-molecule interaction; miniaturized ion mobility spectrometer; model-based resolution enhancement; Chemical compounds; Chemical industry; Chemical sensors; Cost function; Finite element methods; Instruments; Numerical models; Shape measurement; Signal resolution; Spectroscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2008 IEEE
  • Conference_Location
    Lecce
  • ISSN
    1930-0395
  • Print_ISBN
    978-1-4244-2580-8
  • Electronic_ISBN
    1930-0395
  • Type

    conf

  • DOI
    10.1109/ICSENS.2008.4716413
  • Filename
    4716413