DocumentCode
1893501
Title
Low dielectric constant and low shrinkage epoxy system for power electronics applications
Author
Kultzow, Robert ; Mainguy, Brian
fYear
2001
fDate
2001
Firstpage
291
Lastpage
295
Abstract
Power electronics is a fast growing field encompassing a wide variety of applications that make use of electronic circuitry for the conversion of energy. In such applications, the electronic circuits must operate with exceptional reliability in severe environmental conditions and many times under conditions of high dielectric stress. Formulated systems based on epoxy resins are used extensively in electronic as well as electrical applications as either potting and encapsulating systems or as casting products. This paper describes a new epoxy system that has been formulated in combination with specially selected inorganic fillers. It is designed for exceptionally low shrinkage and very low dielectric constant making it ideally suited for these power electronic applications. Although the system will cure at room ambient temperatures, a short elevated temperature post-cure provides the optimum properties. Having a low viscosity, it is easily processed at room temperature with good working life
Keywords
casting; encapsulation; epoxy insulation; permittivity; power electronics; casting products; electronic circuitry; elevated temperature post-cure; encapsulating systems; energy conversion; high dielectric stress; inorganic fillers; insulation; low dielectric constant; low shrinkage; low shrinkage epoxy system; low viscosity; optimum properties; potting systems; power electronics applications; reliability; room ambient temperatures; severe environmental conditions; very low dielectric constant; AC motors; Application software; DC motors; Dielectric constant; Dielectric materials; Electric vehicles; Inverters; Power electronics; Temperature; Torque control;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation Conference and Electrical Manufacturing & Coil Winding Conference, 2001. Proceedings
Conference_Location
Cincinnati, OH
ISSN
0362-2479
Print_ISBN
0-7803-7180-1
Type
conf
DOI
10.1109/EEIC.2001.965629
Filename
965629
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