Title :
Transient modeling of heterostructure optoelectronic switches
Author_Institution :
Dept. of Electr. Eng., Colorado Univ., Denver, CO, USA
Abstract :
A 1-D simulation tool is developed for the transient analysis of four-layer double heterostructure optical switches. The simulated results for an InP/InGaAs PNPN switch show that the minority carrier lifetime could significantly alter the switching characteristics. The breakover voltage and holding current are strong functions of the minority carrier lifetime. The transient simulation results indicate that, although a fast turn-on time can be modeled, it leads to a slow turn-off response as this process is dominated by the recombination mechanism of the carriers
Keywords :
III-V semiconductors; carrier lifetime; digital simulation; gallium arsenide; indium compounds; minority carriers; optical switches; photoconducting devices; semiconductor device models; semiconductor switches; transient response; 1D simulation tool; FARDEV2 program; InP-InGaAs; PNPN switch; breakover voltage; four-layer double heterostructure optical switches; holding current; minority carrier lifetime; optoelectronic switches; recombination mechanism; switching characteristics; transient analysis; transient modeling; transient simulation; turn-off response; turn-on time; Analytical models; Heterojunctions; Impedance; Optical interconnections; Optical switches; Poisson equations; Radiative recombination; Stimulated emission; Transient analysis; Voltage;
Conference_Titel :
University/Government/Industry Microelectronics Symposium, 1993., Proceedings of the Tenth Biennial
Conference_Location :
Research Triangle Park, NC
Print_ISBN :
0-7803-0990-1
DOI :
10.1109/UGIM.1993.297016