Title :
The impact of variability on design methodology
Author :
Visweswariah, Chandu
Author_Institution :
IBM Res., Yorktown Height, NY, USA
Abstract :
Increased variability will have a profound impact on design methodologies for the 65 and 45 nm nodes. Statistical timing will obviously be a key ingredient. This presentation will examine the state-of-the-art in statistical timing, the diagnostics that timing can provide to improve design robustness and performance, the impact of variability on design styles, and the role of statistical timing in aiding synthesis, test and timing sign-off.
Keywords :
integrated circuit design; timing; 45 nm; 65 nm; design methodology; design performance; design robustness; statistical timing; variability impact; Design methodology; Robustness; Testing; Timing; USA Councils;
Conference_Titel :
Integrated Circuit Design and Technology, 2005. ICICDT 2005. 2005 International Conference on
Print_ISBN :
0-7803-9081-4
DOI :
10.1109/ICICDT.2005.1502619
