Title :
The urgency of deep sub-ambient cooling for gigascale integration
Author :
Naeemi, A. ; Joshi, Y. ; Fedorov, A. ; Kohl, P. ; Meindl, J.D.
Author_Institution :
Microelectron. Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
It is shown that the performance of GSI chips will not be a function of how many transistors are integrated in a chip and how fast they can potentially switch; rather, it will be determined by how many transistors can switch per unit time. By lowering the energy per binary switching operation, liquid-air cooling can improve the performance of a power-limited chip by more than 6 generations of technology (more than 13×), significantly lower tunneling and leakage power dissipations (100× and 3.5×, respectively), and improve the performance and reliability of interconnects.
Keywords :
VLSI; circuit reliability; cooling; electrical conductivity transitions; switching; binary switching operation; deep sub ambient cooling; gigascale integration; transistors switching; CMOS technology; Cooling; Costs; Cryogenics; Integrated circuit interconnections; Power generation; Switches; Temperature sensors; Throughput; Tunneling;
Conference_Titel :
Integrated Circuit Design and Technology, 2005. ICICDT 2005. 2005 International Conference on
Print_ISBN :
0-7803-9081-4
DOI :
10.1109/ICICDT.2005.1502623