• DocumentCode
    1893674
  • Title

    The urgency of deep sub-ambient cooling for gigascale integration

  • Author

    Naeemi, A. ; Joshi, Y. ; Fedorov, A. ; Kohl, P. ; Meindl, J.D.

  • Author_Institution
    Microelectron. Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2005
  • fDate
    9-11 May 2005
  • Firstpage
    171
  • Lastpage
    174
  • Abstract
    It is shown that the performance of GSI chips will not be a function of how many transistors are integrated in a chip and how fast they can potentially switch; rather, it will be determined by how many transistors can switch per unit time. By lowering the energy per binary switching operation, liquid-air cooling can improve the performance of a power-limited chip by more than 6 generations of technology (more than 13×), significantly lower tunneling and leakage power dissipations (100× and 3.5×, respectively), and improve the performance and reliability of interconnects.
  • Keywords
    VLSI; circuit reliability; cooling; electrical conductivity transitions; switching; binary switching operation; deep sub ambient cooling; gigascale integration; transistors switching; CMOS technology; Cooling; Costs; Cryogenics; Integrated circuit interconnections; Power generation; Switches; Temperature sensors; Throughput; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Circuit Design and Technology, 2005. ICICDT 2005. 2005 International Conference on
  • Print_ISBN
    0-7803-9081-4
  • Type

    conf

  • DOI
    10.1109/ICICDT.2005.1502623
  • Filename
    1502623