Title :
Device Modeling Beyond Drift Diffusion Approximation
Author :
Engl, W.L. ; Monerzhagen, B.
Author_Institution :
University of Aachen, Germany
Keywords :
Circuit simulation; Computer aided analysis; Delay; Distributed decision making; Electrons; Equations; Hot carrier effects; Impact ionization; Substrates; Testing;
Conference_Titel :
Semiconductor Modeling & Simulation, 1993. SMS Technical Digest. 1993 Symposium on
Conference_Location :
Taipei, Taiwan
Print_ISBN :
0-7803-1225-2
DOI :
10.1109/SMS.1993.664529
