DocumentCode
1893870
Title
SOI partially-depleted ultra low voltage memory and digital circuit design
Author
Thomas, Olivier ; Amara, Ainara ; Valentian, Alexandre
Author_Institution
CEA/LETI, Grenoble, France
fYear
2005
fDate
9-11 May 2005
Firstpage
211
Lastpage
215
Abstract
In this paper the authors investigated design techniques for ultra low voltage (ULV) SRAM and digital circuits based on partially-depleted silicon on insulator (SOI) devices. A systematic design methodology dedicated to SRAM memory cells is presented, it takes into account the floating body effect at different levels of the design process. This methodology is used to design a new 4 transistors self-refresh memory cell and results are compared to the 6 transistors one. ULV digital circuits, ranging from basic gates to a complex wavelet transform are investigated. It is shown that for 130nm SOI partially-depleted technology that using high-speed transistors leads to a significant speed improvement and power saving. The power-delay product is improved by a factor of 2.4.
Keywords
SRAM chips; cellular arrays; high-speed integrated circuits; integrated circuit design; low-power electronics; silicon-on-insulator; 130 nm; SOI; SRAM memory cells; digital circuit design; floating body effect; high speed transistors; partially depleted ultra low voltage memory; self refresh memory cell; wavelet transform; CMOS technology; Design methodology; Digital circuits; Leakage current; Low voltage; Pacemakers; Power supplies; Random access memory; Silicon on insulator technology; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Integrated Circuit Design and Technology, 2005. ICICDT 2005. 2005 International Conference on
Print_ISBN
0-7803-9081-4
Type
conf
DOI
10.1109/ICICDT.2005.1502632
Filename
1502632
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