Title :
Application of T-Cad to Advanced Silicon Devices: Its Usage, Requirements and Problems
Author_Institution :
Komukai-Toshiba-cho, Saiwai-ku, Kawasaki, Japan
Keywords :
Circuit simulation; Circuit testing; Costs; Design automation; Fabrication; Integrated circuit interconnections; Research and development; Silicon devices; Very large scale integration; Visualization;
Conference_Titel :
Semiconductor Modeling & Simulation, 1993. SMS Technical Digest. 1993 Symposium on
Conference_Location :
Taipei, Taiwan
Print_ISBN :
0-7803-1225-2
DOI :
10.1109/SMS.1993.664530