Title :
A Parallel Simulator for Quantum Fault Tolerance in the Presence of Correlated Errors
Author :
Marinescu, Dan C. ; Marinescu, Gabriela M.
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Central Florida Univ., Orlando, FL
Abstract :
Summary form only given. The only realistic means to assess the reliability of a fault tolerant quantum circuit is through simulation. Quantum circuit simulators use Monte Carlo (MC) strategy to randomly sample possible error scenarios using a random number generator. Monte Carlo simulation can be conducted in parallel, but it requires a large amount of CPU cycles and a fair amount of time. All quantum circuit simulators assume a Markovian quantum error model. The simulator we are currently developing uses a combinatorial model and the simulation is carried out in parallel. The simulator is driven by a component which triggers noise events based upon the noise model for a particular physical implementation of quantum gates.
Keywords :
Markov processes; Monte Carlo methods; circuit reliability; circuit simulation; combinatorial mathematics; correlation methods; error statistics; fault tolerant computing; parallel processing; quantum gates; random number generation; Markovian quantum error model; Monte Carlo simulation; circuit reliability; combinatorial model; fault tolerant quantum circuit simulation; noise model; parallel simulator; quantum gate; random correlated error sampling; random number generator; Circuit noise; Circuit simulation; Computational modeling; Computer errors; Computer simulation; Discrete event simulation; Error correction codes; Fault tolerance; Quantum computing; Scalability;
Conference_Titel :
Principles of Advanced and Distributed Simulation, 2008. PADS '08. 22nd Workshop on
Conference_Location :
Roma
Print_ISBN :
978-0-7695-3159-5
DOI :
10.1109/PADS.2008.34
