Title :
A fault primitive based analysis of linked faults in RAMs
Author :
Al-Ars, Zaid ; Hamdioui, Said ; Van de Goor, Ad J.
Author_Institution :
Fac. of Inf. Technol. Syst., Delft Univ. of Technol., Netherlands
Abstract :
Linked faults are very important for memory testing because they reduce the fault coverage of the tests. Their analysis has proven to be a source for new memory tests, characterized by an increased fault coverage for a given test time. This paper presents an analysis of linked faults, based on the concept of fault primitives, such that the whole space of linked faults is investigated, accounted for and validated. The paper also introduces a systematic way to develop tests for such faults.
Keywords :
fault diagnosis; logic testing; random-access storage; RAM; fault primitives; functional fault models; linked faults analysis; march tests; memory testing; single cell linked faults; Design methodology; Electrical fault detection; Information technology; Laboratories; Random access memory; Read-write memory; System testing; Systems engineering and theory;
Conference_Titel :
Memory Technology, Design and Testing, 2003. Records of the 2003 International Workshop on
Print_ISBN :
0-7695-2004-9
DOI :
10.1109/MTDT.2003.1222358
