Abstract :
Presents the table of contents of the proceedings.
Keywords :
Circuit simulation; Circuit testing; Discrete event simulation; Neutrons; Optical fibers; Optical materials; Optical pulses; Photonic integrated circuits; Pulse measurements; Single event upset;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2005. RADECS 2005. 8th European Conference on
Conference_Location :
Cap d´Agde
Print_ISBN :
978-0-7803-9501-5
DOI :
10.1109/RADECS.2005.4365542
