Title :
ITRS commodity memory roadmap
Abstract :
The ITRS (International Technology Roadmap for Semiconductors) roadmap is updated on a yearly basis to forecast industry silicon trends. The ITRS Test Working Group (TWG) identifies the key trends that will have an impact on device test and summarizes them to provide direction to test suppliers. The commodity memory roadmap is a key part of that forecast and covers discrete and embedded DRAM and Flash. The material in this paper represents a very early look at the potential commodity memory roadmap due for release in November of 2003 and is based upon the 2002 roadmap.
Keywords :
DRAM chips; flash memories; semiconductor technology; technological forecasting; ITRS; TWG; commodity flash; commodity memory roadmap; embedded DRAM; forecast industry; international technology roadmap for semiconductors; silicon trend; test suppliers; test working group; Conferences; Lithography; Manufacturing industries; Moore´s Law; Predictive models; Random access memory; Semiconductor device manufacture; Silicon; Technology forecasting; Testing;
Conference_Titel :
Memory Technology, Design and Testing, 2003. Records of the 2003 International Workshop on
Print_ISBN :
0-7695-2004-9
DOI :
10.1109/MTDT.2003.1222362
