• DocumentCode
    1894342
  • Title

    Design and fabrication of new version of Langmuir double circuit for the IR-T1 tokamak

  • Author

    Abbaspour, A. ; Ghorannevis, M. ; Khebreh, R.Z. ; Salami, M.R. ; Bagheri, A.M.

  • Author_Institution
    Plasma Phys. Res. Center, IAU, Tehran, Iran
  • fYear
    1997
  • fDate
    19-22 May 1997
  • Firstpage
    246
  • Abstract
    Summary form only given, as follows. The IR-T1 is an air core transformer type tokamak with no diverter and conducting shell on it. The major parameters are: R=45.00 cm, a=12.50 cm, I/sub p/=20-40 kA, /spl tau//sub B/=20-25 ms, B/sub t/=6.1-9.0 kG, V/sub loop/=2.6-8 V, n/sub e/=0.7-3.0/spl times/10/sup 13/ cm/sup 3/, T/sub e/=150-250 ev, Z/sub eff/<2. The relative measurement of electron temperature and density, was done by a set of asymmetric Langmuir double probes. These probes can be operated in a relatively small voltage region, provides sufficient information about the plasma edge parameters, and therefore there is no need for a direct measurement of the ion saturation current which is about a few milliamperes. The reduction of applied voltage should greatly simplifies the operation of the double probe and eliminates unwanted induced electric fields in small tokamak devices. For this reason we had to design a set of collectors so that the sheath surface area be large enough to consider it as a plasma. The probe power supply was designed and completed at the research institute.
  • Keywords
    Langmuir probes; plasma boundary layers; plasma density; plasma sheaths; plasma temperature; plasma toroidal confinement; power supplies to apparatus; 12.5 cm; 150 to 250 eV; 2.6 to 8 V; 20 to 25 ns; 20 to 40 kA; 45 cm; 6.1 to 9 kG; IR-T1 tokamak; Langmuir double circuit; air core transformer type tokamak; applied voltage; asymmetric Langmuir double probe; collectors; design; electron density; electron temperature; fabrication; induced electric fields; ion saturation current; plasma edge parameters; probe power supply; sheath surface area; small tokamak devices; Circuit faults; Fabrication; Plasma devices; Plasma measurements; Plasma temperature; Probes; Temperature measurement; Tokamaks; Transformer cores; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 1997. IEEE Conference Record - Abstracts., 1997 IEEE International Conference on
  • Conference_Location
    San Diego, CA, USA
  • ISSN
    0730-9244
  • Print_ISBN
    0-7803-3990-8
  • Type

    conf

  • DOI
    10.1109/PLASMA.1997.604985
  • Filename
    604985