DocumentCode
1894421
Title
Microstructural evolution during thermomechanical fatigue of 62 Sn-36 Pb-2 Ag and 60 Sn-40 Pb solder joints
Author
Frear, D.R.
Author_Institution
Sandia Nat. Lab., Albuquerque, NM, USA
fYear
1990
fDate
20-23 May 1990
Firstpage
518
Abstract
Thermomechanical fatigue tests were performed on two near-eutectic Sn-Pb solder alloys, 60 Sn-40 Pb and 62 Sn-36 Pb-2 Ag, to examine the effect silver additions have on solder joints. The cyclic load was found to have consistent trends between the two silver alloys (for given amounts of total strain and strain rates). It was found that a decreasing strain rate increased the life of both alloys equally in thermomechanical fatigue. At slower strain rates, the dislocation substructure recovers faster than it work-hardens, which tends to minimize subsequent recrystallization and heterogeneous coarsening of the solder joint. The microstructure of 62 Sn-36 Pb-2 Ag contained large whisker-like Ag3Sn precipitates that nucleate and grow out from the Cu6Sn5 interfacial intermetallics. At this size, the Ag3Sn precipitates have little effect on the deformation behavior of the solder. The intermetallics are not detrimental in that they do not prematurely crack, nor are they beneficial because they are too large to stabilize the microstructure. It does not appear, from a microstructural viewpoint, that adding silver to near-eutectic Sn-Pb has any significant effect on improving the thermomechanical fatigue behavior
Keywords
fatigue testing; lead alloys; silver alloys; soldering; thermomechanical treatment; tin alloys; SnPb; SnPbAg; cyclic load; deformation behavior; dislocation substructure; fatigue tests; heterogeneous coarsening; microstructure; recrystallization; silver additions; solder joints; strain rates; thermomechanical fatigue; total strain; whisker-like precipitates; Capacitive sensors; Fatigue; Intermetallic; Microstructure; Performance evaluation; Silver; Soldering; Testing; Thermomechanical processes; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1990. ., 40th
Conference_Location
Las Vegas, NV
Type
conf
DOI
10.1109/ECTC.1990.122237
Filename
122237
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