A genetic based algorithm for voltage flicker measurement

Author

Al-Hasawi, W.M. ; EL-Naggar, Khaled M.

Author_Institution

College of Technological Studies, Kuwait

fYear

2002

fDate

2002

Firstpage

600

Lastpage

604

Abstract

Measurements of voltage flicker levels and its frequency is of great concern to the utility in order to prevent unacceptable voltage fluctuation in the supplying system. This paper introduces a new digital approach for the measurements of voltage flicker and its frequency using the genetic algorithm (GAs) optimization technique. The algorithm is tested using simulated data. Effects of number of samples, sampling frequency and the sample window size are studied. Effects of GAs parameters and. operators, such as population size, crossover, mutation probabilities, niching and fitness functions are also studied. Results are reported and discussed.

Keywords

electric noise measurement; flicker noise; genetic algorithms; voltage measurement; crossover; digital measurement; fitness functions; flicker frequency; genetic algorithms; mutation probabilities; niching; optimization; population size; power system; sample window size; sampling frequency; voltage flicker measurement; Educational institutions; Electric variables measurement; Equations; Frequency measurement; Genetic algorithms; Parameter estimation; State estimation; Testing; Voltage fluctuations; Voltage measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrotechnical Conference, 2002. MELECON 2002. 11th Mediterranean

Print_ISBN

0-7803-7527-0

Type

conf

DOI

10.1109/MELECON.2002.1014663

Filename

1014663