DocumentCode
1894510
Title
Error rate considerations for a high bit rate DS-SS BPSK dual space diversity RAKE
Author
Framjee, Richard ; Prabhu, Vasant K.
Author_Institution
Electr. Eng., Univ. of Texas at Arlington, Arlington, TX, USA
fYear
2010
fDate
10-14 Jan. 2010
Firstpage
657
Lastpage
660
Abstract
In high bit rate DS-SS BPSK mobile radio reverse links with RAKE demodulators the frequency selective channel causes intersymbol interference. For many years the standard Gaussian approximation error rate has been used and for high bit rates its accuracy is not known. We compare the Gaussian approximation to error rate derived using total probability theorem, Chernoff and Prabhu bounds with true statistics of intersymbol interference. For signal-to-noise ratio´s (SNR´s) greater than 6 dB (cases of interest), we show that the Gaussian approximation is a much looser upper bound than our bounds. The Prabhu bound which can be tailored to different intersymbol interference conditions is the tightest bound. We show that the RAKE combats incoherent intersymbol interference while the immunity it offers decreases for SNR´s greater than 10 dB. Finally, a dual space diversity RAKE provides an 8 dB space diversity gain.
Keywords
Gaussian processes; approximation theory; demodulation; diversity reception; intersymbol interference; mobile radio; phase shift keying; radio receivers; spread spectrum communication; BPSK; Chernoff bound; DS-SS; Gaussian approximation error rate; Prabhu bound; RAKE demodulators; binary phase shift keying; direct sequence spread srectrum; dual space diversity; frequency selective channel; intersymbol interference; mobile radio reverse links; Binary phase shift keying; Bit rate; Demodulation; Diversity methods; Error analysis; Frequency; Gaussian approximation; Intersymbol interference; Land mobile radio; Probability; Error rate; RAKE; intersymbol interference;
fLanguage
English
Publisher
ieee
Conference_Titel
Radio and Wireless Symposium (RWS), 2010 IEEE
Conference_Location
New Orleans, LA
Print_ISBN
978-1-4244-4725-1
Electronic_ISBN
978-1-4244-4726-8
Type
conf
DOI
10.1109/RWS.2010.5434236
Filename
5434236
Link To Document