• DocumentCode
    189460
  • Title

    Nanocrystalline p-TiO2 based MIS device for efficient acetone detection

  • Author

    Bhowmik, B. ; Hazra, A. ; Dutta, K. ; Bhattacharyya, P.

  • Author_Institution
    Dept. of Electron. & Telecommun. Eng., Indian Inst. of Eng. Sci. & Technol. (IIEST), Howrah, India
  • fYear
    2014
  • fDate
    2-5 Nov. 2014
  • Firstpage
    293
  • Lastpage
    296
  • Abstract
    Present study investigated, the acetone sensing properties of Pd/TiO2/Si Metal Insulator Semiconductor (MIS) devices with nanocrystalline p-TiO2, with crystalline size ~8 nm as the sensing layer. p-TiO2 thin film was synthesized using sol-gel method. After details structural characterization by X-Ray Diffraction (XRD), Field Emission Scanning Electron Microscope (FESEM) and electrical characterization by Van Der Pauw method, the MIS structure was fabricated employing drop coated p-Si substrate. Pd was deposited, on TiO2, as noble metal catalytic electrode while Al was taken as ohmic contact electrode from Si. The sensor study was carried out at relatively lower operating temperatures (50-200°C) for the acetone concentrations of 0.5-50ppm. It was found that MIS devices showed fast response/recovery with appreciable response magnitude in the entire temperature range for all the concentration. The faster response/recovery of MIS devices has been analyzed through an electrical equivalent model including the effect of barrier height between grain boundaries (GBs) and hole trapping at GBs interfaces.
  • Keywords
    MIS devices; elemental semiconductors; gas sensors; hole traps; nanosensors; nanostructured materials; ohmic contacts; organic compounds; palladium; scanning electron microscopy; silicon; thin film sensors; titanium compounds; FESEM; Pd-TiO2-Si; Van Der Pauw method; X-ray diffraction; XRD; acetone detection; drop coated substrate; electrical characterization; field emission scanning electron microscope; hole trapping; metal insulator semiconductor device; nanocrystalline MIS device; ohmic contact electrode; structural characterization; temperature 50 C to 200 C; Charge carrier processes; Gas detectors; MIS devices; Materials; Temperature; Temperature sensors; Acetone; MIS device; electrical equivalent model; p-TiO2;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SENSORS, 2014 IEEE
  • Conference_Location
    Valencia
  • Type

    conf

  • DOI
    10.1109/ICSENS.2014.6984991
  • Filename
    6984991