Title :
A Bayesian Treatment of Risk for Radiation Hardness Assurance
Author :
Ladbury, R. ; Gorelick, J.L. ; Xapsos, M.A. ; O´Connor, T. ; Demosthenes, S.
Author_Institution :
Greenbelt, Greenbelt
Abstract :
We construct a Bayesian risk metric with a method that allows for efficient and systematic use of all relevant information and provides a rational basis for RHA decisions in terms of costs and mission requirements.
Keywords :
Bayes methods; integrated circuit reliability; radiation hardening (electronics); Bayesian risk metric; Bayesian treatment; RHA decisions; radiation hardness assurance; rational basis; relevant information; Aerospace electronics; Bayesian methods; Cost function; NASA; Probability distribution; Random variables; Space technology; Statistical distributions; System testing; Telescopes; probability; quality assurance; radiation effects; reliability estimation; statistics;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2005. RADECS 2005. 8th European Conference on
Conference_Location :
Cap d´Agde
Print_ISBN :
978-0-7803-9502-2
Electronic_ISBN :
0379-6566
DOI :
10.1109/RADECS.2005.4365562
