• DocumentCode
    1894666
  • Title

    Trends in power semiconductor packaging

  • Author

    Desbiens, Donald

  • Author_Institution
    Corporate Technol. Dev., Fairchild Semicond., South Portland, ME, USA
  • fYear
    2005
  • fDate
    18-20 April 2005
  • Firstpage
    6
  • Abstract
    After a number of decades of relative obscurity behind furious advancements in IC packaging technology, a review of recent advances in power device packaging is presented. General trends in relevant electrical and mechanical characteristics are reviewed. Then, the presentation covers in more detail, examples of how advances in both semiconductor content and advanced package design and materials have co-enabled the significant advances in power device capability during the last half decade. Extrapolating the same trends in representative areas to the remainder of the decade serves to highlight where further improvements in materials and techniques can drive continued enhancements in usability, efficiency, reliability, and overall cost of power semiconductor solutions. In addition to the forward looking trends it is important to recognize that the methods for concurrent engineering of these solutions (both the semiconductor content and high performance package capability) are becoming more increasingly dependent on rigorous use of proven multiphysics/FEA tools and techniques. In most cases this insures adequate program definition and timely program completion. In some cases the use of these tools by the teams involved lead directly to unanticipated and insightful solutions to problems which had previously remained intractable. Examples are described with illustrations and commentary.
  • Keywords
    concurrent engineering; power semiconductor devices; semiconductor device packaging; advanced package design; packaging materials; power device packaging; power semiconductor devices; power semiconductor packaging; semiconductor content; semiconductor device packaging; Concurrent engineering; Costs; Integrated circuit packaging; Materials reliability; PROM; Semiconductor device packaging; Semiconductor device reliability; Semiconductor materials; USA Councils; Usability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical and Multi-Physics Simulation and Experiments in Micro-Electronics and Micro-Systems, 2005. EuroSimE 2005. Proceedings of the 6th International Conference on
  • Print_ISBN
    0-7803-9062-8
  • Type

    conf

  • DOI
    10.1109/ESIME.2005.1502760
  • Filename
    1502760