Title :
Merged three-terminal magnetotransistor based on the carrier recombination - deflection effect
Author :
Leepattarapongpan, Chana ; Penpondee, Naritchapan ; Phetchakul, Toempong ; Phengan, Weera ; Chaowicharat, Eakalak ; Hruanun, Charndet ; Poyai, Amporn
Author_Institution :
Thai Microelectron. Center, Chachoengsao
Abstract :
This article presents a merged three terminals magnetotransistor based on the carrier recombination - deflection effect. This particular magnetotransistor structure relies on the combination of difference of base current and collector current in +x and -x directions. As a result, the output voltage and absolute sensitivity to magnetic field will be double. The structure of magnetotransistor consists of one emitter, two collector and two base contacts. The devices can detect magnetic field in vertical direction (BZ) by relying on the difference between base current and collector current (DeltaICB). From the experiment, with emitter current at 5, 8, and 10 mA, the magnetotransistor had the highest sensitivity of 1.125 mV/mT when emitter current was at 10 mA.
Keywords :
electron-hole recombination; magnetic field measurement; magnetic sensors; magnetoelectronics; transistors; carrier recombination-deflection effect; current 10 mA; current 5 mA; current 8 mA; magnetic field absolute sensitivity; magnetic field detection; three-terminal magnetotransistor; CMOS process; CMOS technology; Chaos; Magnetic devices; Magnetic fields; Magnetic sensors; Magnetic separation; Microelectronics; Spontaneous emission; Voltage;
Conference_Titel :
Sensors, 2008 IEEE
Conference_Location :
Lecce
Print_ISBN :
978-1-4244-2580-8
Electronic_ISBN :
1930-0395
DOI :
10.1109/ICSENS.2008.4716463