Title :
Sample — Tip distance influence in Scanning Microwave Microscopy
Author :
Gordienko, Y.E. ; Larkin, C.Y. ; Chkhotua, M.S.E.
Author_Institution :
Kharkiv Nat. Univ. of Radioelectron., Kharkiv, Ukraine
Abstract :
This paper contains a microwave-field distribution dependence of sample-tip distance (STD) along the system probe-distance-sample axis for a finite coaxial resonator probe (CCRP). In addition, the STD dependence of fundamental signals is presented.
Keywords :
atomic force microscopy; microwave resonators; network analysers; distance influence; finite coaxial resonator probe; fundamental signals; microwave-field distribution dependence; sample-tip distance; scanning microwave microscopy; system probe-distance-sample axis; Apertures; Electronic mail; Microscopy; Microwave imaging; Physics; Probes; Q factor;
Conference_Titel :
Microwave and Telecommunication Technology (CriMiCo), 2012 22nd International Crimean Conference
Conference_Location :
Sevastopol, Crimea
Print_ISBN :
978-1-4673-1199-1
