Title :
The analytical approximation of measuring dependences of resonator probes for scanning microwave microscopy
Author :
Gordienko, Y.E. ; Larkin, S.Y. ; Prokaza, A.M.
Author_Institution :
Kharkov Nat. Univ. of Radioelektroniks, Kharkov, Ukraine
Abstract :
The characteristics of conversion of coaxial resonator probes with a measuring aperture were investigated. Approximate expressions were obtained.
Keywords :
atomic force microscopy; microwave imaging; microwave resonators; analytical approximation; coaxial resonator probes conversion; measuring aperture; resonator probe dependency measurement; scanning microwave microscopy; Approximation methods; Educational institutions; Materials; Microwave measurements; Q factor; Semiconductor device measurement; Surface treatment;
Conference_Titel :
Microwave and Telecommunication Technology (CriMiCo), 2012 22nd International Crimean Conference
Conference_Location :
Sevastopol, Crimea
Print_ISBN :
978-1-4673-1199-1
