• DocumentCode
    1894766
  • Title

    Simple predistortion system for compensation of temperature dependent nonlinearity of power amplifiers

  • Author

    Wolf, Norman ; Mueller, Jan-Erik ; Klar, Heinrich

  • Author_Institution
    Inst. of Microelectron., Tech. Univ. of Berlin, Berlin, Germany
  • fYear
    2010
  • fDate
    10-14 Jan. 2010
  • Firstpage
    152
  • Lastpage
    155
  • Abstract
    A change of ambient temperature is a crucial disturbing factor in predistortion systems. This paper presents a simple way to linearize a power amplifier with only one characteristic (AM-AM and AM-PM curve) over the entire temperature range. All characteristic curves measured at different temperatures can be mapped by means of scaling factors to only one resultant curve. The predistortion can be done with the inverse of that resultant curve and the determined scaling factors. The specifications of EDGE standard were chosen to prove the performance of the proposed system. The improvement in linear output power (concerning spec. limit of EVMrms: 8.3 dB and spectral regrowth @400 kHz offset: 3.7dB) is shown to be constant over the entire temperature range from -30°C to 90°C. These are the maximum reachable improvements which confirm the precise operation. This predistortion approach is also valid for volterra series models and their derivative models.
  • Keywords
    power amplifiers; AM-AM curve; AM-PM curve; EDGE standard; frequency 400 kHz; power amplifiers; simple predistortion system; temperature -30 degC to 90 degC; temperature dependent nonlinearity; volterra series models; Energy consumption; High power amplifiers; Linearity; Output feedback; Power amplifiers; Predistortion; Scalability; Table lookup; Temperature dependence; Temperature distribution; CMOS; adaptive predistortion; characterization; linearization; lookup table; power amplifier; predistortion; temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio and Wireless Symposium (RWS), 2010 IEEE
  • Conference_Location
    New Orleans, LA
  • Print_ISBN
    978-1-4244-4725-1
  • Electronic_ISBN
    978-1-4244-4726-8
  • Type

    conf

  • DOI
    10.1109/RWS.2010.5434250
  • Filename
    5434250