Title :
Measurement of Single-Event Effects on a Numerous Commercial DRAM
Author :
Sasada, T. ; Ichikawa, S. ; Kanai, T.
Author_Institution :
Japan Aerosp. Exploration Agency., Tsukuba
Abstract :
To evaluate the characteristics of commercial memory devices for space use, the Japan Aerospace Exploration Agency (JAXA) launched a Solid State Recorder (SSR) on the Mission Demonstration test Satellite-1 (MDS-1 or "Tsubasa") into geo-stationary transfer orbit (GTO) in February 2002. Passing through the radiation belt exposed the MDS-1 to severe radioactive rays in every orbit. This flight experiment measured the rate of single-event upsets (SEUs) on a large number of stacked 64 Mbit dynamic random access memories (DRAMs), and total ionizing dose (TID) effects. As a result, we could calculate the actual SEU rate, and we confirmed the capabilities of two types of on-the-fly error detection and correction (EDAC) mechanisms. This paper presents the results of the space experiment of SSR, focusing especially on SEU analysis.
Keywords :
DRAM chips; aerospace instrumentation; artificial satellites; particle detectors; radiation belts; radiation effects; AD 2002 02; EDAC mechanism; GTO; JAXA; Japan Aerospace Exploration Agency; MDS-1; Mission Demonstration test Satellite-1; SEU rate calcuation; TID effects; Tsubasa Satellite; commercial DRAM; commercial memory devices; dynamic random access memories; error detection and correction mechanism; geostationary transfer orbit; radiation belt exposure; single event effect measurement; single event upsets; solid state recorder; space use; stacked 64 Mbit DRAM; total ionizing dose effects; Aerospace testing; Belts; DRAM chips; Extraterrestrial measurements; Orbital calculations; Random access memory; Single event transient; Single event upset; Solid state circuits; Space missions; CMOS memory integrated circuits; DRAM chips; error correction; proton radiation effects; single-event effects; space vehicle electronics;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2005. RADECS 2005. 8th European Conference on
Conference_Location :
Cap d´Agde
Print_ISBN :
978-0-7803-9502-2
Electronic_ISBN :
0379-6566
DOI :
10.1109/RADECS.2005.4365572
