• DocumentCode
    1895285
  • Title

    Measuring and modeling the cure-dependent rubbery moduli of epoxy molding compound

  • Author

    Yang, D.G. ; Jansen, K.M.B. ; Ernst, L.J. ; Zhang, G.Q. ; Bressers, H.J.L. ; Janssen, J.H.J.

  • Author_Institution
    Delft Univ. of Technol., Netherlands
  • fYear
    2005
  • fDate
    18-20 April 2005
  • Firstpage
    120
  • Lastpage
    125
  • Abstract
    The rubbery (equilibrium) modulus of thermosetting polymers dominates the mechanical behavior at elevated temperature or at long times. It also plays a major role in the residual stress induced during the curing process. In this paper, ai extensive study on the cure-dependent rubbery moduli of silica spheres filled epoxy resin is carried out both experimentally and theoretically. DSC measurements were used for characterization of the cure kinetics and Tg-conversion relationship. Low frequency DMA was used to measure the rubbery modulus build-up during cure. A model based on scaling analysis was applied to describe the evolution of the rubbery shear modulus. A similar model was proposed for the cure-dependent rubbery bulk modulus. Models from the theory of particulate-filled composites were used to predict the rubbery moduli of the molding compound with different filler concentration. The effect of the filler percentage on the rubbery moduli was discussed.
  • Keywords
    curing; elasticity; elastomers; electronics packaging; epoxy insulation; moulding; shear modulus; stress relaxation; cure kinetics; curing process; elevated temperature; epoxy molding compound; filler concentration; low frequency DMA; residual stress; rubbery bulk modulus; rubbery modulus; rubbery shear modulus; scaling analysis; silica spheres filled epoxy resin; thermosetting polymers; Atmospheric modeling; Curing; Epoxy resins; Frequency measurement; Kinetic theory; Polymers; Predictive models; Residual stresses; Silicon compounds; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical and Multi-Physics Simulation and Experiments in Micro-Electronics and Micro-Systems, 2005. EuroSimE 2005. Proceedings of the 6th International Conference on
  • Print_ISBN
    0-7803-9062-8
  • Type

    conf

  • DOI
    10.1109/ESIME.2005.1502785
  • Filename
    1502785